3月15日13時に第15期公募情報を公開いたしました。
4月1日13時より応募者登録サイトへの登録が可能です。
Information on the 15th call for applications was opened at 13:00 on 15 March.
Applicants can register on the registration website from 1 April at 13:00.
Seeing the nanoscale world using atomic force microscopy
Atomic force microscope (AFM) belongs to the scanning probe microscope family, itself stemming from scanning tunneling microscope. Using AFM, one can measure surface topography with atomic/molecular-resolution and measure various properties of the surface and interfaces with nanometer-scale resolution. This is rendered possible by detecting tiny forces exerted on an atomically sharp tip located very close to the sample surface. In this seminar, I will briefly mention the history and principles of atomic force microscope, and review some of the recent achievements obtained with state-of-the-art AFM.