Kei Kobayashi published "Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage" in Applied Physics Letters.

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HOME ＞ Latest news ＞ Kei Kobayashi published "Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage" in Applied Physics Letters.

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Kei Kobayashi published "Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage" in Applied Physics Letters.

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Kei Kobayashi published "Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage" in Applied Physics Letters.